Defects-per-unit control chart for assembled products based on defect prediction models

The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory

c-Chart was frequently used to monitor wafer defects during IC manufacturing. The clustering degree of defect on a wafer will increase along with the area of wafer gradually enlarging. The defect clustering causes the Poisson-based c-chart to exhibit many false alarms. Although several revised control charts have been developed to reduce the number of false alarms, those control charts still ha...

A Robust Dispersion Control Chart Based on M-estimate

Process control charts are proven techniques for improving quality. Specifying the control limits is the most important step in designing a control chart. The presence of outliers may extremely affect the estimates of parameters using classical methods. Robust estimators which are not affected by outliers or the small departures from the model assumptions are applied in this paper to specify th...

A Non-parametric Control Chart for Controlling Variability Based on Squared Rank Test

Control charts are used to identify the presence of assignable cause of variation in the process. Non-parametric control chart is an emerging area of recent development in the theory of SPC. Its main advantage is that it does not require any knowledge about the underlying distribution of the variable. In this paper a non-parametric control chart for controlling variability has been developed. I...

application of upfc based on svpwm for power quality improvement

در سالهای اخیر،اختلالات کیفیت توان مهمترین موضوع می باشد که محققان زیادی را برای پیدا کردن راه حلی برای حل آن علاقه مند ساخته است.امروزه کیفیت توان در سیستم قدرت برای مراکز صنعتی،تجاری وکاربردهای بیمارستانی مسئله مهمی می باشد.مشکل ولتاژمثل شرایط افت ولتاژواضافه جریان ناشی از اتصال کوتاه مدار یا وقوع خطا در سیستم بیشتر مورد توجه می باشد. برای مطالعه افت ولتاژ واضافه جریان،محققان زیادی کار کرده ...

A Double EWMA Control Chart for the Individuals Based on a Linear Prediction