Coupling Automated Electron Backscatter Diffraction with Transmission Electron and Atomic Force Microscopies
نویسندگان
چکیده
منابع مشابه
Electron backscatter diffraction in materials characterization
Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction patterns from crystals, constituents of material. Captured patterns can then be used to determine grain morphology, crystallographic orientation and chemistry of present phases, which provide complete characterization of microstructure and strong correlation to both properties and performance of ...
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Electron backscatter diffraction (EBSD) originated in materials science and has transferred to biomineral research providing insight into fossil and modern biominerals. An electron microscopy technique, EBSD requires a fine polished sample surface where the electron beam diffracts in the first few lattice layers, identifying mineral, polymorph and crystallographic orientation. The technique is ...
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The present study investigates the crystal preferred orientation (CPO) of quartz crystals in psammitic rocks to ascertain the deformationmechanism using electron backscatter diffraction (EBSD) on quartz crystals from north of the Renvyle-Bofin Slide (RBS) nearLetterfrack in western Ireland. Complete crystallographic orientations were determined for several thousand individual quartz crystalsin ...
متن کاملDirect detection of electron backscatter diffraction patterns.
We report the first use of direct detection for recording electron backscatter diffraction patterns. We demonstrate the following advantages of direct detection: the resolution in the patterns is such that higher order features are visible; patterns can be recorded at beam energies below those at which conventional detectors usefully operate; high precision in cross-correlation based pattern sh...
متن کاملElectron Diffraction Using Transmission Electron Microscopy
Electron diffraction via the transmission electron microscope is a powerful method for characterizing the structure of materials, including perfect crystals and defect structures. The advantages of electron diffraction over other methods, e.g., x-ray or neutron, arise from the extremely short wavelength (≈2 pm), the strong atomic scattering, and the ability to examine tiny volumes of matter (≈1...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2000
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927600037193