Correlation between micrometer-scale ripple alignment and atomic-scale crystallographic orientation of monolayer graphene
نویسندگان
چکیده
منابع مشابه
Correlation between micrometer-scale ripple alignment and atomic-scale crystallographic orientation of monolayer graphene
Deformation normal to the surface is intrinsic in two-dimensional materials due to phononic thermal fluctuations at finite temperatures. Graphene's negative thermal expansion coefficient is generally explained by such an intrinsic property. Recently, friction measurements on graphene exfoliated on a silicon oxide surface revealed an anomalous anisotropy whose origin was believed to be the forma...
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ژورنال
عنوان ژورنال: Scientific Reports
سال: 2014
ISSN: 2045-2322
DOI: 10.1038/srep07263