Conduction Processes in Thick Film Resistors. Part II
نویسندگان
چکیده
منابع مشابه
Noise properties of thick-film resistors in extended temperature range
Results of thorough experimental studies on electrical properties of thick-film resistors (TFRs) have been overviewed and summarized. Experiments covered resistance and noise measurements in wide temperature range. Low-frequency noise spectroscopy has been used for the investigations of fluctuating phenomena. Sample resistors were prepared of various combinations of commercial and laboratory-ma...
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The non-linear electro-ultrasonic spectroscopy was used as a non-destructive testing method for the polymer based and cermet thick film resistors evaluation. We carried out the correlation between this method and standard testing methods as noise spectroscopy and the third harmonic voltage measurements. The measuring set-up with the ultrasonic transducer working on the frequency range 10 kHz to...
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Thick-film resistors (TFRs) consist of a percolating network of conducting oxide nanoparticles dispersed in an insulating glassy matrix, whose resistive properties are dominated by quantum tunneling across insulating layers separating adjacent conducting grains. Tunneling processes are at the origin of the high sensitivity of the TFRs resistances to applied strains. We have measured transport a...
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Thermal noise and 1/f noise are known to exist in carbon composition (CC) and thick film (TF) resistors. A circuit involving a differential instrumentation op-amp was used to measure the noise of a resistor under test. The noise spectra of these resistors were measured using a dynamic signal analyzer that performs an auto-correlation Fourier transform from the time domain to the frequency domai...
متن کاملEvaluation of conductive-to-resistive layers interaction in thick-film resistors
Low-frequency noise spectroscopy is used to examine the interactions between resistive and conductive films that take place during thick-film resistor (TFR) fabrication. Two noise parameters are introduced to quantitatively describe the strength of these interactions. They refer to intensity and repeatability of the noise generated in the resistor interfaces. Extensive experimental studies perf...
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ژورنال
عنوان ژورنال: ElectroComponent Science and Technology
سال: 1976
ISSN: 0305-3091
DOI: 10.1155/apec.3.141