Comparison between different Photothermal Deflection methods to determine thermal properties of bulk semiconductor samples
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چکیده
منابع مشابه
Different Non Destructive Photothermal Deflection Techniques to Determine Thermal Properties of Bulk Semiconductors
In this paper we will describe and compare different non destructive Photothermal Deflection methods easy to develop and not expensive which permit the determination of the thermal diffusivity of bulk semiconductor material. The first method consists to draw the experimental amplitude and phase of the photothermal deflection signal versus square root modulation frequency. The sample placed in a...
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ژورنال
عنوان ژورنال: Journal of Physics: Conference Series
سال: 2010
ISSN: 1742-6596
DOI: 10.1088/1742-6596/214/1/012110