Circuit Reliability Analysis Using Symbolic Techniques
نویسندگان
چکیده
منابع مشابه
Symbolic Analysis of Circuit Reliability
Due to shrinking feature size and significant reduction in noise margins, nanoscale circuits have become more susceptible to manufacturing defects, noise-related transient faults and interference from radiation. Traditionally, soft errors have been a much greater concern in memories than in logic circuits. However, as technology continues to scale, logic circuits are becoming more susceptible t...
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ژورنال
عنوان ژورنال: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
سال: 2006
ISSN: 0278-0070
DOI: 10.1109/tcad.2006.882592