Choice of tip, signal stability, and practical aspects of piezoresponse-force-microscopy
نویسندگان
چکیده
منابع مشابه
Choice of tip, signal stability, and practical aspects of piezoresponse-force-microscopy.
Piezoresponse force-microscopy (PFM) has become the standard tool to investigate ferroelectrics on the micro- and nanoscale. However, reliability of PFM signals is often problematic and their quantification is challenging and thus not widely applied. Here, we present a study of the reproducibility of PFM signals and of the so-called PFM background signal which has been reported in the literatur...
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A novel approach for nanoscale imaging and characterization of the orientation dependence of electromechanical properties-vector piezoresponse force microscopy (Vector PFM)-is described. The relationship between local electromechanical response, polarization, piezoelectric constants, and crystallographic orientation is analyzed in detail. The image formation mechanism in vector PFM is discussed...
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Contact and non-contact based atomic force microscopy (AFM) approaches have been extensively utilized to explore various nanoscale surface properties. In most AFM-based measurements, a concurrent electrostatic effect between the AFM tip/cantilever and sample surface can occur. This electrostatic effect often hinders accurate measurements. Thus, it is very important to quantify as well as remove...
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We discuss practical aspects of Kelvin probe force microscopy ~KFM! which are important to obtain stable images of the electric surface potential distribution at high spatial resolution ~,100 nm! and high potential sensitivity ~,1 mV! on conducting and nonconducting samples. We compare metal-coated and semiconducting tips with respect to their suitability for KFM. Components of the metal coatin...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2015
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.4929572