Characterization of Structural Defects in (Cd,Zn)Te Crystals Grown by the Travelling Heater Method

Structural defects and compositional uniformity remain the major problems affecting performance of (Cd, Zn)Te (CZT) based detector devices. Understanding mechanism growth defect formation is therefore fundamental to improving crystal quality. In this frame, space experiments for CZT by Travelling Heater Method (THM) under microgravity are scheduled. A detailed ground-based program was performed determine experimental parameters three crystals were grown THM. The structural defects, homogeneity resistivity these investigated. ZnTe content variation observed at interface a high degree stress associated with extensive dislocation networks induced, which propagated into region according birefringence X-ray White Beam Topography (XWBT) results. By adjusting parameters, variations resulting efficiently reduced. addition, it revealed that large inclusions grain boundaries can generate stress, leading slip bands subgrain boundaries. dominant including boundaries, cracks in interior crystals, led crystals. bulk as-grown ranged from 109 Ωcm 1010 Ωcm.