Characterization of ALD grown Ti x Al y N and Ti x Al y C thin films

Growth and Phase Stability Studies of Epitaxial Sc-Al-N and Ti-Al-N Thin Films

Connections between C(X) and C(Y), where Y is a subspace of X

In this paper, we introduce a method by which we can find a close connection between the set of prime $z$-ideals of $C(X)$ and the same of $C(Y)$, for some special subset $Y$ of $X$. For instance, if $Y=Coz(f)$ for some $fin C(X)$, then there exists a one-to-one correspondence between the set of prime $z$-ideals of $C(Y)$ and the set of prime $z$-ideals of $C(X)$ not containing $f$. Moreover, c...

Electronic structure of charge- and spin-controlled Sr(1-(x+y))La(x+y)Ti(1-x)Cr(x)O3.

We present the electronic structure of Sr(1-(x+y))La(x+y)Ti(1-x)Cr(x)O3 investigated by high-resolution photoemission spectroscopy. In the vicinity of the Fermi level, it was found that the electronic structure was composed of a Cr 3d local state with the t(2g)3 configuration and a Ti 3d itinerant state. The energy levels of these Cr and Ti 3d states are well interpreted by the difference of th...

Electrical characterization of photo - oxidized Si 1 x y Ge x C y films

Strained silicon germanium carbon (Si1 x yGexCy or SiGeC) on silicon was oxidized using a novel photo-oxidation process. The growth rate of the oxide was investigated and found to depend heavily on the germanium and carbon concentrations. MOS capacitors were fabricated with the resulting oxide and electrical characterization was done. The SiGeC MOS capacitors proved to have high leakage current...

Growth and Characterization of Ti-Si-N Thin Films