Analytic determination of the three-dimensional distribution of dislocations using synchrotron X-ray topography
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چکیده
منابع مشابه
Synchrotron X-Ray Diffraction Topography of Semiconductor Heterostructures
7 VP T J üú û üŗ 4 J W VN»»S » û þĀŗ VS O ". . *Ć Ğ Ğ /,(Ą ðĞ Ć Ć ăāĂĚ ăÿüĚ Āú Ě þăüû Ě üŗ Preface " Jokainen tsäänssi on mahdollisuus! " – Matti Nykänen (Every chance is an opportunity) The work presented in this thesis was carried out in Optoelectronics Laboratory , of Electrical Engineering between 2003 and 2012. I want to express my sincere gratitude to Professor Harri Lipsanen for supervis...
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ژورنال
عنوان ژورنال: Journal of Applied Crystallography
سال: 2006
ISSN: 0021-8898
DOI: 10.1107/s0021889805038719