An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Beilstein Journal of Nanotechnology
سال: 2020
ISSN: 2190-4286
DOI: 10.3762/bjnano.11.111