Advanced Terahertz Frequency-Domain Ellipsometry Instrumentation for In Situ and Ex Situ Applications
نویسندگان
چکیده
منابع مشابه
Variable-wavelength frequency-domain terahertz ellipsometry.
We report an experimental setup for wavelength-tunable frequency-domain ellipsometric measurements in the terahertz spectral range from 0.2 to 1.5 THz employing a desktop-based backward wave oscillator source. The instrument allows for variable angles of incidence between 30 degrees and 90 degrees and operates in a polarizer-sample-rotating analyzer scheme. The backward wave oscillator source h...
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ژورنال
عنوان ژورنال: IEEE Transactions on Terahertz Science and Technology
سال: 2018
ISSN: 2156-342X,2156-3446
DOI: 10.1109/tthz.2018.2814347