A universal blown film apparatus for in situ X-ray measurements
نویسندگان
چکیده
منابع مشابه
In Situ Measurements of X-Ray-Induced Silver Diffusion into a Ge30Se70 Thin Film
High-resolution X-ray photoelectron spectroscopy is used to identify the mechanism of X-ray-induced Ag diffusion into Ge30Se70 chalcogenide glass thin films, which are prepared in situ to avoid oxygen contamination. From the analysis of Ge 3d, Se 3d, and Ag 3d core levels, and valence band spectra, changes in the electronic structure are determined as Ag diffuses gradually with increasing irrad...
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ژورنال
عنوان ژورنال: Chinese Journal of Polymer Science
سال: 2017
ISSN: 0256-7679,1439-6203
DOI: 10.1007/s10118-017-2000-z