A Technical Survey on Delay Defects in Nanoscale Digital VLSI Circuits
نویسندگان
چکیده
As technology scales down, digital VLSI circuits are prone to many manufacturing defects. These defects may result in functional and delay-related circuit failures. The number of test escapes grows when is downscaled. Small delay (SDDs) hidden (HDDs) critical importance industries today since they the source most reliability problems. Improving quality creating new methods, algorithms, designs requires a comprehensive study these This article reviews effect impact SDD HDD logic circuits. It also analyzes relevant fault models, automatic pattern generation (ATPG) faster-than-at-speed testing (FAST), cell-aware (CA) based tests, metrics, diagnosis SDDs HDDs, commercially available Electronic Design Automation (EDA) tools. Based on analysis, benefits drawbacks several accessible approaches addressed.
منابع مشابه
A Digital Metastability Model for VLSI Circuits
PhD Thesis A Digital Metastability Model for VLSI Circuits PhD candidate Thomas Polzer Reviewers Ao. Univ.-Prof. Dipl.-Ing. Dr. techn. Andreas Steininger Prof. Alex Yakovlev, PhD, DSc This thesis develops a digital model for predicting failure rates caused by marginal triggering, so called metastability, of CMOS storage elements. To derive the underlying model, various storage elements are simu...
متن کاملDigital Circuits Delay Analysis
The speed of digital circuit is one of the most restricting factors in the deep sub-micron and multigigahertz integrated circuits design. It is directly dependent on the circuit delay. Scaling down the technologies and increasing the operational frequency make the delay problems more important. This paper studies the delay in digital circuits, starting from the design process, scaling down the ...
متن کاملDelay Estimation of VLSI Circuits from a High-Level View†
Estimation of the delay of a Boolean function from its functional description is an important step towards design exploration at the register transfer level (RTL). This paper addresses the problem of estimating the delay of certain optimal multi-level implementations of combinational circuits, given only their functional description. The proposed delay model uses a new complexity measure called...
متن کاملA survey of power estimation techniques in VLSI circuits
With the advent of portable and high-density microelectronic devices, the power dissipation of very large scale integrated (VLSI) circuits is becoming a critical concern. Accurate and e cient power estimation during the design phase is required in order to meet the power speci cations without a costly redesign process. In this paper, we present a review/tutorial of the power estimation techniqu...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Applied sciences
سال: 2022
ISSN: ['2076-3417']
DOI: https://doi.org/10.3390/app12189103