A reliability analysis for electronic devices under an extension of exponentiated perks distribution

This paper presents a reliability analysis for electronic devices (ED) with bathtub curve-shaped failure times. An extension of the exponentiated perks distribution (EPD) is proposed analysis. The this new based on Alpha Power Transformation, so Exponentiated Perks Distribution (AEXP) introduced. AEXP has three shape parameters and one scale parameter, allowing greater flexibility to represent rates in an increasing, decreasing, or curve form. Some useful properties engineering context are presented. were estimated via Maximum Likelihood Method. Finally, two case studies focused ED used compare other distributions similar rate representation properties. obtained results show that better describes behavior than considered