منابع مشابه
Goniometer-based femtosecond X-ray diffraction of mutant 30S ribosomal subunit crystals
In this work, we collected radiation-damage-free data from a set of cryo-cooled crystals for a novel 30S ribosomal subunit mutant using goniometer-based femtosecond crystallography. Crystal quality assessment for these samples was conducted at the X-ray Pump Probe end-station of the Linac Coherent Light Source (LCLS) using recently introduced goniometer-based instrumentation. These 30S subunit ...
متن کاملHopping Conductivity in Single Crystals (Cd0.6Zn0.32Mn0.08)3As2 (RESEARCH NOTE)
The growth processes of Tetragonal single crystals of solid solution (Cd0.6Zn0.32Mn0.08)3As2, space group P42/nmc, has been synthesized by Bridgman method. Conductivity and magnetoresistance of (Cd0.6Zn0.32Mn0.08)3As2 were measured in the range 1.6K to 300K and in magnetic field up to 25 T. Crossover from Mott variable-range-hopping conductivity mechanism close to helium temperatures. In this w...
متن کاملThe reliability of a smartphone goniometer application compared with a traditional goniometer for measuring first metatarsophalangeal joint dorsiflexion
BACKGROUND Adequate sagittal plane motion of the first metatarsalphalangeal joint (1st MTPJ) is important during normal gait and goniometric measurement is commonly used as a diagnostic and outcome assessment tool. We aimed to determine the intra and inter-rater reliability together with the concurrent validity of a universal plastic goniometer (UG) and a smartphone applicationlication (Dr G) f...
متن کاملGoniometer Crosstalk Compensation for Knee Joint Applications
Electrogoniometers are prone to crosstalk errors related to endblocks rotation (general crosstalk) and to the characteristics of each sensor (individual crosstalk). The aim of this study was to assess the crosstalk errors due to endblock misalignments and to propose a procedure to compensate for these errors in knee applications. A precision jig was used to simulate pure ± 100° flexion/extensio...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 1980
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.1136344