A Fully Integrated DAC for CMOS Position-Based Charge Qubits with Single-Electron Detector Loopback Testing
نویسندگان
چکیده
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ژورنال
عنوان ژورنال: IEEE Solid-State Circuits Letters
سال: 2020
ISSN: 2573-9603
DOI: 10.1109/lssc.2020.3018707