A Fault Detection Method for Combinational Circuits
نویسندگان
چکیده
منابع مشابه
A Fault Detection Method for Combinational Circuits
As transistors become increasingly smaller and faster and noise margins become tighter, circuits and chip specially microprocessors tend to become more vulnerable to permanent and transient hardware faults. Most microprocessor designers focus on protecting memory elements among other parts of microprocessors against hardware faults through adding redundant error-correcting bits such as parity b...
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Test compaction is an effective technique for reducing test data volume and test application time. In this paper, we present a new static test compaction algorithm based on test vector decomposition and clustering. Test vectors are decomposed and clustered in an increasing order of faults detection count. This clustering order gives more degree of freedom and results in better compaction. Exper...
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ژورنال
عنوان ژورنال: International Journal of Advanced Network, Monitoring and Controls
سال: 2016
ISSN: 2470-8038
DOI: 10.21307/ijanmc-2016-004