8th IEEE Electron Devices Technology and Manufacturing Conference

AllerGen’s 8th research conference

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The 8th Sanibel conference.

Risk and Fault Tolerance Analysis for Robotics and Manufacturing - Electrotechnical Conference, 1996. MELECON '96., 8th Meditarranean

This paper describes a novel method for analyzzng, within one framework, several iinpurlaril types of risk associated with robotics and manufacturing applacalions. We will build on the established technaque of Fault Tree Analysis to analyze the rzsk/henej%s of the physical process, and extend the concept 2 0 budd a dual structure for environmental costs/benejts. In addition, our framework inclu...

8th Conference on Real Numbers and Computers

Two-dimensional electron gas charged-coupled devices (2DEG-CCD's) - Electron Devices, IEEE Transactions on

The two-dimensional electron gas charge-coupled device (ZDEG-CCD) structure for 111-V and other heterojunction materials is reviewed. Device design considerations for gate, insulator, and channel material parameters are presented. Optimization of ZDEG-CCD performance parameters such as well capacity, dark current, and transfer efficiency is discussed. Experimental results on AIGaAs/GaAs uniform...