porous silicon samples were prepared by electrochemical etching method for different etching times. the structural properties of porous silicon (ps) samples were determined from the atomic force microscopy (afm) measurements. the surface mean root square roughness (σ rms) changes as function of porosity were studied, and the influence of etching time on porosity and roughness was studied too. u...

CNC turning is widely used as a manufacturing process through which unwanted material is removed to get the high degree of surface rough. In this research article, Taguchi technique was coupled with grey relation analysis (GRA) to optimize the turning parameters for simultaneous improvement of productivity, average surface roughness (Ra), and root mean square roughness (Rq).Taguchi technique L2...

the objective of this research work is to evaluate the surface roughness of polyacrylonitrile (pan) nanowebs. for this purpose the nanowebs have been prepared in different concentrations of pan solution from 11 to 15% (by wt). surface roughness of nanowebs was evaluated by entropy algorithm (ent) as well as atomic force microscopy (afm) and then the results of two methods have been compared. to...

Zinc Aluminum Oxide (ZAO) thin films were deposited on glass substrates by DC reactive magnetron sputtering technique with high purity Zn and Al targets. After the deposition, the films were annealed in vacuum from 200 to 500 C. Surface roughness measurement of ZAO thin films in the nanometer scale can be accurately determined using the atomic force microscopy. Surface roughness and grain size ...

We extend quantum models of nanowire surface scattering to incorporate bulk resistivity and extract an expression for the increased resistivity due to surface roughness. To learn how to improve conductivity, we calculate conductivity degradation from individual wavelengths of surface roughness, and show how these can be convolved to give resistivity for arbitrary surfaces. We review measurement...

Soil roughness is a very important parameter affecting radar backscattering coefficient. This paper wants to introduce a new method to retrieve the combined roughness parameter 2 / Zs s l = on the condition of rough surface. To achieve this goal, two experiments are conducted: (1) Advanced Integral Equation Model (AIEM) is used to simulate backscattering coefficients; and (2) a new algorithm to...

In radar signature analysis, the root mean square (RMS) surface slope is utilized to assess the relative contribution of multiple scattering effects. For an exponentially correlated surface, an effective RMS slope can be determined by truncating the high frequency tail of the roughness spectrum. The choice of the cutoff frequency and the effect on surface scattering simulations are discussed.

In radar signature analysis, the root mean square (RMS) surface slope is utilized to assess the relative contribution of multiple scattering effects. For an exponentially correlated surface, an effective RMS slope can be determined by truncating the high frequency tail of the roughness spectrum. The choice of the cutoff frequency and the effect on surface scattering simulations are discussed.

There are a number of techniques for estimating the amount of weathering a clast has undergone. These usually have the objective of establishing an ordinal chronology of geomorphological surfaces, or investigation of site-specific conditions affecting weathering rates. Three such techniques are applied to a dated sequence of alluvial fan segments in southern Tunisia. Two of these techniques dep...

Surface roughness measurement is widely used to estimate the quality of the product during manufacturing processes. It has a great importance in manufacturing fields such as ceramic tiles, glass, and iron. Many are using surface profile-meter with a contact stylus to measure the surface roughness of work piece. In the stylus method, a stylus is moved along the surface and the vertical movement ...