nanoparticles of mn0.5zn0.5-xcdxfe2o4 with x varying from x = 0.0 to 0.3 were prepared by wet chemical co-precipitation method. the structural and magnetic properties were studied by using x-ray diffraction (xrd), scanning electron microscope (sem), transmission electron microscopy (tem) and electron paramagnetic resonance (epr) technique. the lattice constant increases with increase in cd cont...

it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...

Backscattered electron Kikuchi patterns (BEKP) suitable for crystallographic phase analysis can be collected in the scanning electron microscope (SEM) with a newly developed charge coupled device (CCD) based detector. Crystallographic phase identification using BEKP in the SEM is unique in that it permits high magnification images and BEKPs to be collected from a bulk specimen. The combination ...

cadmium oxide (cdo) nanoparticles were prepared by precipitation method using cadmium acetate and ammonia solution. presence of chemical species, were verified by fourier transform infra red (ftir) spectrum. from x-ray diffraction (xrd) spectrum the particle size, d-spacing value and structure of the nanoparticle were analysed. size of the nanoparticles and the elemental composition were detect...

The scanning electron microscopy (SEM) is probably one the most fascinating examination approach that has been used since more than two decades to detailed inspection of micro scale objects. Most of the scanning electron microscopes could only produce 2D images that could not assist operational analysis of microscopic surface properties. Computer vision algorithms combined with very advanced ge...

Mechanisms responsible for the contrast between differently doped areas in semiconductors, which is observed in electron micrographs, is discussed as regards the key factors determining the sign and magnitude of the contrast. Experimental data obtained by means of the scanning electron microscope (SEM), scanning low energy electron microscope and photoelectron emission microscope are reviewed t...

The same sherd was analyzed using a scanning electron microscope with energy dispersive spectroscopy (SEM-EDS) and a micro X-ray fluorescence tube attached to a scanning electron microscope (Micro-XRF-SEM) to compare the effectiveness of elemental detection of iron-based pigment. To enhance SEM-EDS mapping, the sherd was carbon coated. The carbon coating was not required to produce Micro-XRF-SE...

Electron microscopy of materials in a gaseous environment has its origins as far back as about the 1950s for the transmission electron microscope (TEM), later followed by developments for the scanning electron microscope (SEM). Focusing on the latter, this review outlines the history and commercial development of the technology, culminating in the environmental SEM (ESEM), and the techniques fo...