An X-ray diffraction line will broaden considerably when steels change into martensitic structure on quenching. The results presented in this paper show that X-ray diffraction technique can be employed for a rapid and nondestructive measurement of hardness of hardened steel. Measurement on various quenched and tempered steels showed that the breadth of its diffraction peak increased with increa...

We discuss the connection of high-energy gamma-ray measurements with precision atomic mass determinations. These rather different technologies, properly combined, are shown to lead to new values for the neutron mass and the molar Planck constant. We then proceed to describe the gamma-ray measurement process using the GAMS4 facility at the Institut Laue-Langevin and its application to a recent m...

The determination of residual or applied stress through X-ray or neutron diffraction is generally regarded as a mature method. Most x-ray diffractometers can be used to perform a measurement of lattice strain vs. tilt angle, which is then converted into stress. The apparent simplicity of the conversion (the sinø law comes to mind) betrays the fact that elastic and plastic anisotropy often cause...

in the present work, we report a suitable approach for the preparation of batio3 nanostructures via the hydrothermal condition using dolapix et85 as surfactant. the powders were investigated by x-ray diffraction (xrd), scanning election microscopy (sem), energy-dispersive x-ray spectroscopy (edax), field emission transmission electron microscopy (fetem), selected area electron diffraction (saed...

Mike Meier University of California, Davis September 13, 2004 Figure 1. FEG-SEM image of nanosized aluminum oxide powder. Note the magnification and the size of the micron bar. Also note how the smaller particles and the edges of the larger particles appear to be somewhat transparent. This is because much of the 5 kV electron beam can pass through these thinner parts of the particles. CRYSTALLI...

generally arranged at a distance of 0.1 nm to 0.5 nm from one another. When such a substance is irradiated with X-rays having a wavelength roughly equivalent to the interatomic or intermolecular distance, the Xray diffraction phenomenon will take place. X-ray diffraction is widely used in the semiconductor field because it is nondestructive and yields crystal structure information relatively ea...

We describe the technical aspects of the in-situ X-ray diffraction of a protein crystal prepared by a nanodroplet-based crystallization method. We were able to obtain diffraction patterns from a crystal grown in a capillary without any manipulation. Especially in our experimental approach, the crystals that moved to the nanodroplet interface were fixed strongly enough to carry out X-ray diffr...

We have demonstrated the use of a high-repetition-rate 46.9-nm tabletop laser to characterize diffraction gratings designed for grazing-incidence operation in the soft-x-ray spectral region. The efficiencies for various diffraction orders were measured as a function of angle of incidence and compared with the results of model simulations. This measurement technique provides benchmarks with whic...