the available shear correction factors have mainly been developed for homogeneous isotropic plates and/or assuming that no shear tractions are imposed on the top and bottom surfaces of the plate. in the present research, a more general case of a circular functionally graded plate subjected to non-uniform normal and shear tractions at the top and bottom surfaces is considered. these non-uniform ...

The available shear correction factors have mainly been developed for homogeneous isotropic plates and/or assuming that no shear tractions are imposed on the top and bottom surfaces of the plate. In the present research, a more general case of a circular functionally graded plate subjected to non-uniform normal and shear tractions at the top and bottom surfaces is considered. These non-uniform ...

bending analysis of multilayer graphene sheets (mlgss) subjected to non-uniform shear and normal tractions is presented. the constitutive relations are considered to be non-classical based on nonlocal theory of elasticity. based on the differential transformation method, numerical illustrations are carried out for circular and annular geometries. the effects of nano scale parameter, radius of c...

Bending analysis of multilayer graphene sheets (MLGSs) subjected to non-uniform shear and normal tractions is presented. The constitutive relations are considered to be non-classical based on nonlocal theory of elasticity. Based on the differential transformation method, numerical illustrations are carried out for circular and annular geometries. The effects of nano scale parameter, radius of c...

Traction Force Microscopy (TFM) is a widespread method used to recover cellular tractions from the deformation that they cause in their surrounding substrate. Particle Image Velocimetry (PIV) is commonly used to quantify the substrate's deformations, due to its simplicity and efficiency. However, PIV relies on a block-matching scheme that easily underestimates the deformations. This is especial...

An efŽ cient method has been developed for analyzing the three-dimensional electromechanical deformations of a monoclinic piezoelectric laminate subjected to surface tractions and electric displacements on the top and bottom surfaces. The procedure combines the transfer matrix method with the asymptotic expansion technique. The electromechanical coupled formulation is reduced to a hierarchy of ...

Current methodologies used for the inference of thin film stress through curvature measurements are strictly restricted to stress and curvature states which are assumed to remain uniform over the entire film/substrate system. By considering a circular thin film/substrate system subject to non-uniform, but axisymmetric misfit strain distributions in the thin film, we derived relations between th...

Current methodologies used for the inference of thin film stress through curvature measurements are strictly restricted to stress and curvature states which are assumed to remain uniform over the entire film/substrate system. By considering a circular thin-film/substrate system subject to arbitrarily non-uniform misfit strain distributions, we derive relations between the film stresses and the ...

Current methodologies used for the inference of thin film stress through curvature measurements are strictly restricted to stress and curvature states which are assumed to remain uniform over the entire film/substrate system. By considering a circular thin film/substrate system subject to non-uniform, but axisymmetric temperature distributions, we derive relations between the film stresses and ...