Non-destructive detection and evaluation of invisible cracks in metal structures is an important matter in several critical environments including ground transportation, air transportation and power plants. In this paper, a high-Q near-field Microwave probe is designed and fabricated using defected ground structures for surface and subsurface crack detection in metal structures. For this purpos...

Near-field scanning optical microscopy is a powerful technique for imaging below the diffraction limit, which has been extensively used in biomedical and nanophotonics. However, when electromagnetic fields under measurement are strongly confined, they can be heavily perturbed by presence of near-field probe itself. Here, taking inspiration from scattering-cancellation invisibility cloaks, Huyge...

According to the electromagnetic uniqueness theorem, radiation behavior of an antenna under test (AUT) can be recovered from measurements two tangential components its radiated fields on enclosing surface. In practice, conducted in radiating near-field (NF) AUT utilize probe antennas finite size. Thus, instead discrete field values, spatially blurred signals are acquired. The influence compensa...

A plane subsonic jet was subjected to periodic oscillations in the near nozzle region by a twin vane system. During excitation, the jet was found to spread significantly and entrain mass much more than its steady counterpart. Time averaged static pressure measured in the flow field with a disc probe exhibited prominent well defined suction regions different from that of a steady jet.

scanning near-field optical microscopy (snom) is a member of scanning probe microscopes (spms) family which enables nanostructure investigation of the surfaces on a wide range of materials. in fact, snom combines the spm technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. in this paper, a qualified overview of ...

In this article results of a comparison of two NSOM probe characterization methods are presented. Scanning electron microscopy analysis combined with electromagnetic field modeling using the finite difference in time domain method are compared with measured far-field radiation diagrams of NSOM probes. It is shown that measurement of far-field radiation diagrams can be an efficient tool for dail...

Current electronic circuits are characterised by their compact design of miniaturisation; however, such a feature has also contributed to the rise electromagnetic compatibility issues. This study introduces technique develop magnetic field probe for near-field measurement. The aims at performing debugging interference on an integrated circuit. Certain processes, as designing microstrip line in ...