according to recent achievements in nano technology we can see its effects in different engineering fields. in nano manufacture process the first essential step is modeling coordinately in order to make it available different software are developing for this propose.  in this paper nano modeling for two papers is developed first understanding structure in nano and micro size and second simulati...

v-shaped and triangular cantilevers are widely employed in atomic force microscope (afm) imaging techniques due to their stability. for the design of vibration control systems of afm cantilevers which utilize patched piezo actuators, obtaining an accurate system model is indispensable prior to acquiring the information related to natural modes. a general differential quadrature element method (...

An analytical model is developed of the interaction of the cantilever tip of an atomic force microscope with the sample surface that treats the cantilever and sample as independent systems coupled by a nonlinear force acting between the cantilever tip and a volume element of the sample surface. To maintain equilibrium, the volume element is subjected to a restoring force from the remainder of t...

Cantilevers fabricated by means of micromachining techniques are usually used for atomic force microscopy. In this paper, the spring constant of an atomic force microscope (AFM) cantilever is determined by using a large-scale cantilever. Since the spring constant of the large-scale cantilever is calibrated accurately, the spring constant of the AFM cantilever is determined precisely by measurin...

A Si adatom on a Si(111)-(7 × 7) reconstructed surface is a typical atomic feature that can rather easily be imaged by a non-contact atomic force microscope (nc-AFM) and can be thus used to test the atomic resolution of the microscope. Based on our first principles density functional theory (DFT) calculations, we demonstrate that the structure of the termination of the AFM tip plays a decisive ...

The atomic force microscope ~AFM! is a powerful tool for investigating surfaces at atomic scales. Harmonic balance and power balance techniques are introduced to analyze the tapping-mode dynamics of the atomic force microscope. The harmonic balance perspective explains observations hitherto unexplained in the AFM literature. A nonconservative model for the cantilever–sample interaction is devel...

Over the past ten years the atomic force microscope has developed more and more into a spectroscopic tool rather than a simple microscope. Still, for most non-expert users corning from fields other than physics, such as biomedical scientists, dealing with the advanced spectroscopic AFM techniques beyond imaging is not so simple. This tutorial answers some how-to-do-it questions concerning the m...

..................................................x Acknowledgments......................................xi Statement of Originality..............................xiii List of Publications and Presentations.............xiv Chapter One: Introduction...........................................................................1 1.1 Motivation..............................................................

magnetic force microscope ( mfm ) is a powerful technique for mapping the magnetic force gradient above the sample surface. herein, single-wall carbon nanotubes (swcnt) were used to fabricate mfm probe by dielectrophoresis method which is a reproducible and cost-effective technique. the effect of induced voltage on the deposition manner of carbon nanotubes (cnt) on the atomic force microscope (...

Reproducible images of uncoated DNA in the atomic force microscope (AFM) have been obtained by imaging plasmid DNA on mica in n-propanol. Specially sharpened AFM tips give images with reproducible features several nanometers in size along the DNA. Plasmids can be dissected in propanol by increasing the force applied by the AFM tip at selected locations.