In this paper a Bayesian approach for accelerated life testing will be considered. It will be assumed that the failure times at the different stress levels follow a Weibull distribution and exponential distribution, respectively. In accelerated life tests, the components are exposed to an environment that is more severe that the usual environment, such that the components will fail in a shorter...

Conclusions This article develops a Bayes model for step-stress accelerated life testing. The failure times at each stress level are exponentially distributed, but the specification of strict adherence to a time transformation function is not required. Rather, prior information is used to define indirectly a multivariate prior distribution for the failure rates at the various stress levels. Ou...

of the Ph.D. Thesis entitled Some Optimum Fully and Partially Accelerated Life Testing Models in Reliability

In accelerated life testing, the products are tested at high stress conditions and the results are used to draw inferences about the product lifetime at the normal stress condition. The products can fail due to one of the several possible causes of failure which need not be independent. In this paper, we consider the accelerated life testing in the presence of dependent competing risks. We prop...

In many of the studies concerning Accelerated life testing (ALT), the log linear function between life and stress which is just a simple re-parameterization of the original parameter of the life distribution is used to obtain the estimates of original parameters but from the statistical point of view, it is preferable to work with the original parameters instead of developing inferences for the...

Reliability is one of the main salient assets of modern electronic systems and its improvement is of utmost importance in manufacturingof high-reliability electronic products. The only possible means of improving the operational characteristics of electronic systems and reducing their overall lifecycle costs is improving their reliability. This is possible through designing in reliability at th...

in this paper, we consider an  i.e., multiple step-stress accelerated life testing (alt) experiment with unequal duration of time . it is assumed that the time to failure of a product follows rayleigh distribution with a log-linear relationship between stress and lifetime and also we assume a generalized khamis-higgins model for the effect of changing stress levels. taking into account that the...

This article focuses on the understanding and discussion of accelerated life test (AL T) procedures applied to reciprocal compressors. AL T procedures were analyzed and classified according to time proportional and proportional hazard models. Many papers were published and extensive research has been done in the area of AL T procedures. However, the fast paced changing world demands for a new g...