CPD chairman’s message, Paolo Scardi 2 CPD projects: 2 Quantitative Phase Analysis RR, Ian Madsen Editor’s message, Robert Dinnebier 2 Thirty five years ago, Hugo Rietveld 3 WWW sites related to Powder Diffraction 5 IUCr Commission on Powder Diffraction 5 Rietveld Refinement from Powder Diffraction Data Beyond the abilities of Rietveld analysis: MEM-based pattern fitting with synchrotron X-ray ...

Displacement of the specimen surface from the instrument rotation axis in reflection optics diffractometry introduces bias into the measured Bragg peak positions thereby causing systematic shifts in the 2θ-dependent Rietveld parameters. Specimen transparency also results in 2θ-bias, which tends to mimic that from specimen displacement. The authors have investigated the influence of specimen dis...

The second English edition is largely based on the third German edition of the Teubner Studienbuch “ Kristallstrukturbestimmung,” which appeared in 2002. In particular, Chapter 7, dealing with experimental methods, has been extensively rewritten. In view of the huge recent advances in the use of area detector systems for single-crystal data collection, their description has replaced much of the...

Innovative applications of the Rietveld method [1-3] are likely to include new developments in microstructure analysis. More and more samples show microstructure effects on line profile shape, width and position. Reasons are obviously the powder diffractometer resolution improvements at leading synchrotron sources, and the increasing user number. When the minimal full width at half maximum is a...

The microstructure of gold catalysts supported on rutile was obtained by Rietveld refinement. Three-dimensional images of the crystallites were generated in real space, as well as 3-D images of the microstrain distribution in reciprocal space. These images were used to analyze the effect of the different parameters of the refinement models on the interpretation of the microstructure of the samp...

With thousands of references to `Rietveld refinement' it is forgotten that the method did not suddenly appear in a flash of inspiration of a single person, but was the result of the work of three individuals working in the 1960s at the Reactor Centre Netherlands at Petten, Loopstra, van Laar and Rietveld. This paper outlines the origins of `profile refinement', as it was called at Petten, and a...

The quantitative Rietveld analyses of twenty samples of CAC from four different manufacturers over the world, one synthetic mixture and a NIST standard were performed using synchrotron radiation. As compared with conventional XRD, synchrotron powder diffraction permitted to find new minor phases, improve the characterization of solid solutions of iron rich CAC phases and reduce preferential ori...