We treat the problem of analog integrated circuit (IC) obfuscation toward intellectual property (IP) protection against reverse engineering. Obfuscation is achieved by camouflaging effective geometry layout components via use fake contacts, which originally were proposed for gate in digital ICs. present a library obfuscated components, we give recommendations camouflaging, discuss foreseen atta...

This paper discusses Mixed Signal LSI technology with embedded power transistors. Trends in Mixed Signal LSI technology are explained at first. Mixed signal LSI technology has proceeded with the help of fine fabrication technology and SOI technology. The BEOL transistor is a new development, which uses InGaZnO (IGZO) as its TFT channel material. The BEOL transistor is one future device which en...

This paper describes the integration of analog, digital, and mixed-signal IC design in the undergraduate ECE curriculum at Lafayette College. This integration is being accomplished by adding IC design coverage to the required electronics sequence and including analog and mixed-signal coverage in a what was previously an “alldigital” VLSI Design elective. As a result, all ECE students at Lafayet...

In the last three years, a program focused in mixed-signal/RF IC testing has been established at the University of Florida. Industry collaboration has been key in providing direction, support and equipment for this effort. Through this effort, I see a strong role for building RF IC test research groups in the university environment to better solve the hard IC test problems. In addition, the mix...

An increasing demand on qualified IC designers requires engineering schools to train more graduates with specialty in IC design. These newly trained graduates should not only have strong fundamentals, but also good analytical and practical skills. They should be able to quickly adapt to the commercial environment and require minimum training when hired by the design firms. A twosemester project...

Application of built-in self-test circuitries allows to improve the testing quality and reliability of complex analog and mixed-signal IC. BIST-circuitry is integrated to original circuit for the purpose of test signal generation, measurement of output responses and decision-making about correctness of circuit under test functioning. The most part of BIST-circuitries for analog and mixed-signal...

Almost any new circuitry which falls under the category Design For Testability (DFT) is perceived by designers as a problem to be endured to make someone else’s job easier, i.e. that of the manufacturing engineer. After all, no net benefit is gained by simply transferring problems from manufacturing into design. Even if there is a net benefit, the designer may not derive a benefit. For a new DF...

An application of behavioral modeling for mixed-signal test generation and applied results are presented. It is shown that test debugging can be provided in the verification test system before silicon by utilizing simulated behavioral mixed-signal models. Due to the behavioral modeling technique, the computational performance was enhanced to a level allowing efficient test development and debug...

The P1149.4 mixed-signal boundary scan standard is demonstrated with a CMOS integrated circuit. Design issues and characterization data are presented.