نتایج جستجو برای: Force lithography

تعداد نتایج: 195635  

Journal: :iranian journal of chemistry and chemical engineering (ijcce) 2008
sedigheh sadegh hassani zahra sobat hamid reza aghabozorg

nanoscale science and technology has today mainly focused on the fabrication of nano devices. in this paper, we study the use of lithography process to build the desired nanostructures directly. nanolithography on polymethylmethacrylate (pmma) surface is carried out by using atomic force microscope (afm) equipped with silicon tip, in contact mode. the analysis of the results shows that the dept...

Journal: :international journal of nano dimension 0
s. sadegh hassani nanotechnology research center, research institute of petroleum industry (ripi), tehran, iran. z. sobat nanotechnology research center, research institute of petroleum industry (ripi), tehran, iran.

the scanning probe microscopes (spms) based lithographic techniques have been demonstrated as an extremely capable patterning tool. manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. in this paper, a qualified overview of diverse lithog...

Hamid Reza Aghabozorg Sedigheh Sadegh Hassani, Zahra Sobat

Nanoscale science and technology has today mainly focused on the fabrication of nano devices. In this paper, we study the use of lithography process to build the desired nanostructures directly. Nanolithography on polymethylmethacrylate (PMMA) surface is carried out by using Atomic Force Microscope (AFM) equipped with silicon tip, in contact mode. The analysis of the results shows that the ...

Journal: :Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 1997

Journal: :Nanotechnology 2011
Narendra Kurra Gyan Prakash S Basavaraja Timothy S Fisher G U Kulkarni Ronald G Reifenberger

Electrochemical oxidation and etching of highly oriented pyrolytic graphite (HOPG) has been achieved using biased atomic force microscopy (AFM) lithography, allowing patterns of varying complexity to be written into the top layers of HOPG. The graphitic oxidation process and the trench geometry after writing were monitored using intermittent contact mode AFM. Electrostatic force microscopy reve...

Journal: :Journal of Visualized Experiments 2014

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