Cumulative Count of Conforming (CCC) charts are utilized for monitoring the quality characteristics in high-quality processes. Executive cost of control charts is a motivation for researchers to design them with the lowest cost. Usually in most researches, only one objective named cost function is minimized subject to statistical constraints, which is not effective method for economic-statistic...

The cumulative count of a conforming (CCC) control chart is used for high quality processes.The CCC − r chart is an improvement of the CCC chart that is based on the cumulative number of items inspected until observing r non-conforming ones. This paper aims to propose a new approach for manufacturer’s decision making according to the criteria among the available options. The o...

In high-yields process monitoring, the Geometric distribution is particularly useful to control the cumulative counts of conforming (CCC) items. However, in some instances the number of defects on a nonconforming observation is also of important application and must be monitored. For the latter case, the use of the generalized Poisson distribution and hence simultaneously implementation of two ...

In high quality industrial processes, the control chart is design based on cumulative count of conforming (CCC) items is very useful. In this paper, the performance of CCC-r chart with variable sampling intervals (CCC-rVSI chart) in the presence ofinspectionerrors isinvestigated. The efficiency of CCC-rVSI chart is compared with CCC-r chart with fixed sampling interval (CC...

This paper proposes three synthetic-type control charts to monitor the mean time-between-events of a homogenous Poisson process. The first proposed chart combines an Erlang (cumulative time between events, Tr ) chart and a conforming run length (CRL) chart, denoted as Synth-Tr chart. The second proposed chart combines an exponential (or T) chart and a group conforming run length (GCRL) chart, d...

The cumulative conformance count (CCC) charts are widespread in process monitoring of high-yield manufacturing. Recently, it is found the use of variable sampling interval (VSI) scheme could further enhance the efficiency of the standard CCC charts. The average time to signal (ATS) a shift in defect rate has become traditional measure of efficiency of a chart with the VSI scheme. Determining th...