Today for the expedition of the identification and timely correction of process deviations, it is necessary to use advanced techniques to minimize the costs of production of defective products. In this way control charts as one of the important tools for the statistical process control in combination with modern tools such as artificial neural networks have been used. The artificial neural netw...

Control chart pattern recognition is one of the most important tools to identify the process state in statistical process control. The abnormal process state could be classified by the recognition of unnatural patterns that arise from assignable causes. In this study, a wavelet based neural network approach is proposed for the recognition of control chart patterns that have various characterist...

Statistical process control (SPC) is a method for improving the quality o f products. Control charting plays a most important role in SPC. SPC control charts arc used for monitoring and detecting unnatural process behaviour. Unnatural patterns in control charts indicate unnatural causes for variations. Control chart pattern recognition is therefore important in SPC. Past research shows that alt...

This paper presents a semi-supervised learning algorithm for a control chart pattern recognition system. A learning neural network is trained with labeled control chart patterns based on unsupervised learning. We then use the classification method based on a statistical correlation coefficient approach to test patterns. We find that the proposed semi-supervised learning algorithm is effective a...

Control chart pattern (CCP) recognition techniques are widely used to identify the potential process problems in modern industries. Recently, artificial neural network (ANN) –based techniques are very popular to recognize CCPs. However, finding the suitable architecture of an ANN-based CCP recognizer and its training process are time consuming and tedious. In addition, because of the black box ...

On-line automated process analysis is an important area of research since it allows the interfacing of process control with computer integrated manufacturing (CIM) techniques. The inflexibility and high computational costs of traditional SPC pattern recognition methodologies have led researchers to investigate artificial neural network applications to control chart pattern recognition. This pap...

statistical process control (spc) charts play a major role in quality control systems, and their correct interpretation leads to discovering probable irregularities and errors of the production system. in this regard, various artificial neural networks have been developed to identify mainly singular patterns of spc charts, while having drawbacks in handling multiple concurrent patterns. in this...