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nanoscale science and technology has today mainly focused on the fabrication of nano devices. in this paper, we study the use of lithography process to build the desired nanostructures directly. nanolithography on polymethylmethacrylate (pmma) surface is carried out by using atomic force microscope (afm) equipped with silicon tip, in contact mode. the analysis of the results shows that the dept...

Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...

the objective of this research work is to evaluate the surface roughness of polyacrylonitrile (pan) nanowebs. for this purpose the nanowebs have been prepared in different concentrations of pan solution from 11 to 15% (by wt). surface roughness of nanowebs was evaluated by entropy algorithm (ent) as well as atomic force microscopy (afm) and then the results of two methods have been compared. to...

in this research, the effect of catalyst type on the cnts synthesis was investigated. the carbonnanotubes (cnts) were produced on stainless steel substrates and two of catalyst with differentcharacteristics by using thermal chemical vapor deposition (tcvd) method. the catalysts have theimportant role for the growth carbon nanotubes (cnts). acetylene gas (c2h2) diluted by nh3 wasused as the reac...

in recent years, it has become evident that it is necessary to systematically and accurately define particle characteristics in order to understand the potential toxicity of nanoparticles to biological systems. the properties that need to be emphasized are size, shape, dispersion, doping, aggregation, functionalization, physical and chemical properties, surface area, and surface chemistry. rout...

atomic force microscopy (afm) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. afm is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. there are several methods and many ways to modify the tip of the afm to investigate surface properties, ...