نتایج جستجو برای: very large

تعداد نتایج: 1567007  

Journal: :IEEE Trans. on CAD of Integrated Circuits and Systems 1988
Erich Barke

A comparison is made between various approximations of the line-to-ground capacitance problem in a VLSI environment. It is shown that with up-to-date dimensions, the simple parallel-plate model is no longer adequate. However, easy-to-use and fast-to-compute formulas exist that result in accurate and reliable capacitance values. The parasitic capacitance problem is three-dimensional by nature. T...

1994
Wayne H. Wolf

Of course, from childhood to forever, we are always thought to love reading. It is not only reading the lesson book but also reading everything good is the choice of getting new inspirations. Religion, sciences, politics, social, literature, and fictions will enrich you for not only one aspect. Having more aspects to know and understand will lead you become someone more precious. Yea, becoming ...

2016
Sandeep Sharma Dharmendra Verma

This paper reviewed the comparison between different clock distribution schemes which used for low power VLSI design which are the most important aspect in the industry. The main clock distribution schemes are single driver clock scheme and distributed buffers clock scheme. There are different tradeoffs in both the techniques such as size of buffers, number of buffers etc.

Journal: :Journal of Navigation 1971

Journal: :IEEE Transactions on Emerging Topics in Computing 2022

Residue Number Systems (RNS) are proven to be effective in speeding up computations involving additions and products. For these representations, there exists efficient modular reduction algorithms that can used the context of arithmetic over finite fields or modulo large numbers, especially when cryptographic engineering. Their independence allows random draws bases, which also makes it possibl...

Journal: :Journal of Chemical Education 1992

Journal: :Journal of the Australian Mathematical Society 1978

Journal: :Journal of Electrical & Electronic Systems 2017

Journal: :American Journal of Neuroradiology 2017

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