The increasing need for precise determination of the atomic arrangement of non-periodic structures in materials design and the control of nanostructures explains the growing interest in quantitative transmission electron microscopy. The aim is to extract precise and accurate numbers for unknown structure parameters including atomic positions, chemical concentrations and atomic numbers. For this...

The increasing use of environmental transmission electron microscopy (ETEM) in materials science provides exciting new possibilities for investigating chemical reactions and understanding both the interaction of fast electrons with gas molecules and the effect of the presence of gas on high-resolution imaging. A gaseous atmosphere in the pole-piece gap of the objective lens of the microscope al...

The optical properties and electronic structure of aluminium nitride are determined using valence electron energy-loss spectroscopy in a dedicated scanning transmission electron microscope. Quantitative analysis of the experimental valence electron energy-loss spectra to determine the electronic structure encompasses single scattering deconvolution of the valence electron energy-loss spectra to...

When the development of correctors started in the 1970s, chromatic correction was already the main goal. The first corrector that could improve the resolution of an electron microscope was a chromatic corrector for a scanning electron microscope. Within the last three decades, the development of transmission electron microscopes (TEMs) was to a large extent driven by the attempt to improve the ...

Citation: Mačković M, Przybilla T, Dieker C, Herre P, Romeis S, Stara H, Schrenker N, Peukert W and Spiecker E (2017) A Novel Approach for Preparation and In Situ Tensile Testing of Silica Glass Membranes in the Transmission Electron Microscope. Front. Mater. 4:10. doi: 10.3389/fmats.2017.00010 a novel approach for Preparation and In Situ Tensile Testing of silica glass Membranes in the Transmi...