An aperiodic test clock methodology to reduce test time of wafer sort has been recently proposed. In practice, however, an automatic test equipment (ATE) allows only a small number of clock periods and finding those is a mathematically complex problem. This paper proposes an algorithm for optimal selection of any given number of tester clock periods. Keywords-Aperiodic clock, Test time reductio...

In this paper, test methodology using parametric measurement unit is proposed for Automated Test Equipment (ATE) systems using 600MHz Driver, Comparator, and Active load (DCL). ATE systems is a very important means to reduce the device test cost, and the systems should be able to test several modes to check the performance characteristics of the device. The proposed methodology provides four di...

Remote labs are increasingly used in a variety of blended-learning scenarios, with the objective of complementing the work done in real labs. In such cases, the workbenches present in the real labs comprise a set of instruments that may be used over the internet. The lab work to be done by the students may be carried out from any location within or outside the campus, enabling them to carry out...

An earlier application note, "Coherent Sampling vs. Window Sampling," covered the basics of coherent sampling. It showed differences between tests performed with coherent sampling and windowed sampling conditions. The following technical discussion is a follow-up note, which deals with the proper selection of test tones and instruments to successfully test and evaluate a high-speed ADC's AC per...

In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate within the context of a situation. Instead, testing follows a rigid, predetermined, fault-isolation sequence that is based on an embedded fault tree. Current test programs do not tolerate instrument failure and cannot red...

Automated test equipment (ATE) is used extensively in production test and device characterization of integrated circuits (ICs). With future devices forecasted to contain hundreds of I/O cells operating at speeds from 5Gb/s to 10Gb/s, the challenge to test those devices with an ATE system is becoming more complex. The speed bottleneck is moving from the pin electronics of the ATE to the test fix...

COD is usually measured and the test is simple and easy to perform with the right equipment and can be done in 2 hours. BOD usually takes 5 days and TOC used to require large expensive pieces of equipment that could measure the sample in minutes, but was cost prohibitive. There are now test in tube kits that utilize COD digestors to run a test similar to a COD test method. Below are more detail...

This paper proposes a static test approach suitable for built-in-self-test (BIST) of Analog-to-digital converter Intellectual Property (IP). Static parameters (INL, DNL, gain, offset) are tested without using test equipment. The proposed BIST structure is applicable for testing models of analog-to-digital converters up to 12bits of resolution. Comparison results with dynamic test equipment vali...