نتایج جستجو برای: ray microscopy
تعداد نتایج: 469867 فیلتر نتایج به سال:
This paper has reported on the electrical and nonstructural of polymer-based materials in corporation NiO (Nickel oxide) in concentrations of 0.2%, 0.4% and 0.8% by weight of PVA (polyvinyl alcohol) polymer. Nanocrystallites phases and properties were characterized with using X-ray diffraction (XRD), Fourier transfer infrared radiation (FTIR),Energy distribution X-ray(EDX) techniques and X-Map ...
In current work, CdS/black carbon nanocomposites were successfully synthesized with the aid of chestnut and cadmium nitrate as the starting reagents. Besides, the effects of preparation parameters such as reaction time, and precursor concentration on the morphology of products and removal of heavy metals (Hg+2, Pb+2) were studied by scanning electron microscopy images and batch adsorption mode....
Actinide materials demonstrate a wide variety of interesting physical properties in both bulk and nanoscale form. To better understand these materials, a broad array of microscopy techniques have been employed, including transmission electron microscopy (TEM), electron energy-loss spectroscopy (EELS), energy dispersive X-ray spectroscopy (EDXS), high-angle annular dark-field imaging (HAADF), sc...
The Ultra-nanocrystalline diamond (UNCD) was synthesized by the detonation of a high explosive mixture in water confinement. The presence of a diamond phase was revealed by X-ray diffraction (XRD) and transmission electron microscopy (TEM). X-ray line broadening (XRLB) was used to evaluate the peak profiles of diamond nanoparticles and their corresponding average crystallite sizes. The micro st...
Nano-crystalline particles of CeO2 have been synthesized by a low temperature chemical precipitation method. The precursor materials used in this research were Ce(NO3)3.6H2O, NaOH and diethylene glycol as surfactant. X-ray powder diffraction results showed that face centered cubic CeO2 nanoparticles with crystalline size in nanometer scale were formed. Scanning electron microscopy measurement s...
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