نتایج جستجو برای: photon scanning tunneling microscopy

تعداد نتایج: 369301  

Journal: :Journal of the Vacuum Society of Japan 2011

2016
D A Zanin L G De Pietro Q Peter A Kostanyan H Cabrera A Vindigni Th Bähler D Pescia U Ramsperger

We perform scanning tunnelling microscopy (STM) in a regime where primary electrons are field-emitted from the tip and excite secondary electrons out of the target-the scanning field-emission microscopy regime (SFM). In the SFM mode, a secondary-electron contrast as high as 30% is observed when imaging a monoatomic step between a clean W(110)- and an Fe-covered W(110)-terrace. This is a figure ...

Journal: :Physical review. B, Condensed matter 1996
Prins Jansen van Kempen H

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