نتایج جستجو برای: ion beam application

تعداد نتایج: 1053523  

2015
Irma Berrueta Razo Sadia Sheraz Alex Henderson Nicholas P. Lockyer John C. Vickerman

RATIONALE To discover the degree to which water-containing cluster beams increase secondary ion yield and reduce the matrix effect in time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging of biological tissue. METHODS The positive SIMS ion yields from model compounds, mouse brain lipid extract and mouse brain tissue together with mouse brain images were compared using 20 keV C60(+...

2007
Stephan RAUSCHENBACH

The vacuum deposition of complex functional molecules and nanoparticles by thermal sublimation is often hindered due to their extremely low vapor pressure. This especially impedes the application of ultrahigh vacuum (UHV) based analytical and surface modification techniques for the investigation of these extremely interesting systems. On the other hand, specimen prepared under ambient condition...

2003
W. Brezna H. Wanzenböck A. Lugstein E. Bertagnolli E. Gornik J. Smoliner

In this article, we explore the application of Scanning Capacitance Microscopy (SCM) for studying focused ion beam (FIB) induced damage in silicon. We qualitatively determine the technologically important beam shape by measuring the SCM image of FIB processed implantation spots and by comparison of topographical and SCM data. Further, we investigate the question how deep impinging ions generate...

2005
A. Adonin J. Jacoby M. Kulish D. Nikolaev N. Shilkin P. Spiller S. Udrea

Diagnostic of the ion beam profile is a very important part of the any heavy ion beam experiment. Usually, scintillators are used for these purposes. In the HHT-experimental area of GSI, uranium beams of up to 4,5·10 particle per bunch focused in the spot side of 0,8mm x 1,6mm are used [1]. The ion beam of such intensity is capable to destroy any usual scintillator by one shot. In this case, a ...

Journal: :The Review of scientific instruments 2016
P Agostinetti M Giacomin G Serianni P Veltri F Bonomo L Schiesko

The Radio Frequency (RF) negative hydrogen ion source prototype has been chosen for the ITER neutral beam injectors due to its optimal performances and easier maintenance demonstrated at Max-Planck-Institut für Plasmaphysik, Garching in hydrogen and deuterium. One of the key information to better understand the operating behavior of the RF ion sources is the extracted negative ion current densi...

2015
Antoni Rucinski Stephan Brons Daniel Richter Gregor Habl Jürgen Debus Christoph Bert Thomas Haberer Oliver Jäkel

BACKGROUND Ion beam therapy represents a promising approach to treat prostate cancer, mainly due to its high conformity and radiobiological effectiveness. However, the presence of prostate motion, patient positioning and range uncertainties may deteriorate target dose and increase exposure of organs at risk. Spacer gel injected between prostate and rectum may increase the safety of prostate can...

2009
T. Tsang S. Bellavia R. Connolly D. Gassner Y. Makdisi T. Russo P. Thieberger D. Trbojevic A. Zelenski

A new luminescence beam profile monitor is realized in the polarized hydrogen gas jet target at the Relativistic Heavy Ion Collider (RHIC) facility. In addition to the spin polarization of the proton beam being routinely measured by the hydrogen gas jet, the luminescence produced by beam-hydrogen excitation leads to a strong Balmer series lines emission. A selected hydrogen Balmer line is spect...

2012
M. M. Abdelrahman

This paper studies the influence of various parameters and conditions on the performance of an ion-beam extraction system, the trajectories of the particles in the beam being simulated by a commercial software (SIMION 3D). Space-charge effects are accounted for and criteria allowing optimization of the system are proposed. Ion beam trajectories with and without space charge have been determined...

2001
Xu Wang Timothy C. Strand David Marx Demetri Psaltis

We describe a technique for studying scattering from subwavelength features. A simple scatterometer was developed to measure the scattering from the single-submicrometer, subwavelength features generated with a focused ion beam system. A model that can describe diffraction from subwavelength features with arbitrary profiles is also presented and shown to agree quite well with the experimental m...

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