Scanning electron microscope (SEM) images for semiconductor line-width measurements are generally acquired in a topdown configuration. As semiconductor dimensions continue to shrink, it has become increasingly important to characterize the cross-section, or sidewall, profiles. Cross-section imaging, however, requires the physical cleaving of the device, which is destructive and time-consuming. ...

The nature of solids-liquid flows often results in non-uniform profiles of solids volume fraction and axial solids velocity across the flow cross-section. In order to measure the solids volumetric flow rate in these situations it is necessary to measure the profiles of the local solids volume fraction and axial solids velocity and to obtain mean values of the solids volume fraction, solids axia...

Today, personalization in digital libraries and other information systems occurs separately within each system that one interacts with. However, there are several potential improvements w.r.t. such isolated approaches. Investments of users in personalizing a system either through explicit provision of information or through long and regular use are not transferable to other systems. Moreover, u...