نتایج جستجو برای: atomic force microscopy afm

تعداد نتایج: 429884  

2017
Elena P. Ivanova Gregory S. Watson Jolanta A. Watson Sverre Myhra

Atomic force microscopy (AFM) is becoming an increasingly important tool-of-thetrade in the life sciences. In the study of morphology and dynamics of cells it has the particular merit of being able to interact non-destructively with live cells in vitro. Thus it occupies a unique niche in the suite of techniques that has so far been dominated by the photonand electron-optical microscopies and sp...

2005

Atomic force microscopy (AFM) techniques allowed us to visualize pentameric organization of immunoglobulins IgM and domain structure of immunoglobulins IgG. Together with obtained by AFM data on conditions of ribosome-inactivating proteins' type II (RIPsII) tetramerization these results contribute to many investigations concerning RIPsII biology as well as antigen-antibody and lectin-ligand int...

2017
Samir Mekid

A new in-process atomic-force microscopy (AFM) based inspection is presented for nanolithography to compensate for any deviation such as instantaneous degradation of the lithography probe tip. Traditional method used the AFM probes for lithography work and retract to inspect the obtained feature but this practice degrades the probe tip shape and hence, affects the measurement quality. This pape...

Journal: :Journal of structural biology 1997
J Fritz D Anselmetti J Jarchow X Fernàndez-Busquets

During the last years, atomic force microscopy (AFM) has developed from a microscopy tool for solid-state surface science toward a method employed in many scientific disciplines, such as biology, for investigating individual molecules on a nanometer scale. This article describes the current status of the imaging possibilities of AFM on RNA, IgG, and gold-labeled cell adhesion proteoglycans, as ...

2007
Yongliang Yang Eric Yue Ma J Polesel-Maris L Aeschimann A Meister R Ischer E Bernard T Akiyama M Giazzon P Niedermann U Staufer R Pugin N F de Rooij P Vettiger H Heinzelmann

Atomic Force Microscopy (AFM) techniques are used with oneor two-dimensional arrays of piezoresistive probes for parallel imaging. We present a newly designed AFM platform to drive these passivated piezoresistive cantilever arrays in air and liquid environments. Large area imaging in liquid as well as qualitative and quantitative analysis of biological cells are demonstrated by the means of pie...

2002
Nicola H. Green Stephanie Allen Martyn C. Davies Clive J. Roberts Saul J.B. Tendler Philip M. Williams

Over the past 15 years, advances in the ¢eld of atomic force microscopy (AFM) have broadened its use from a high-resolution imaging instrument to a device capable of detecting and quantifying single molecular forces between surfaces in nearnative conditions. This article reviews developments in the force sensing ¢eld and focuses particularly on research that has seen the AFM utilised to produce...

2005
Franz J. Giessibl

We review the progress in the spatial resolution of atomic force microscopy (AFM) in vacuum. After an introduction of the basic principle and a conceptual comparison to scanning tunneling microscopy, the main challenges of AFM and the solutions that have evolved in the first twenty years of its existence are outlined. Some crucial steps along the AFM’s path towards higher resolution are discuss...

Journal: :Journal of colloid and interface science 2004
Vincent Dupres Terri Camesano Dominique Langevin Antonio Checco Patrick Guenoun

We report investigations of hair surface potential under wetting at the nanometric scale by atomic force microscopy (AFM). Surface potential imaging was used to characterize the electrostatic properties of the hair samples. We found that the surface potential noticeably increases along the edges of the cuticles. These results are correlated with wetting behavior of different liquids performed u...

2006
Jonathan A. Brant Kelly M. Johnson Amy E. Childress

In this investigation, two methods for characterizing membrane surface potential are investigated. Results from atomic force microscopy (AFM) analyses are compared with streaming potential measurements. In calculating surface potential from AFM force measurements, assumptions of constant charge and constant potential were both considered for modeling electrostatic interactions. For a ceramic mi...

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