نتایج جستجو برای: atomic force microscope afm

تعداد نتایج: 302535  

Journal: :Science 1999
Piner Zhu Xu Hong Mirkin

A direct-write "dip-pen" nanolithography (DPN) has been developed to deliver collections of molecules in a positive printing mode. An atomic force microscope (AFM) tip is used to write alkanethiols with 30-nanometer linewidth resolution on a gold thin film in a manner analogous to that of a dip pen. Molecules are delivered from the AFM tip to a solid substrate of interest via capillary transpor...

Journal: :The Review of scientific instruments 2014
E Schaefer-Nolte F Reinhard M Ternes J Wrachtrup K Kern

We present the design and performance of an ultra-high vacuum (UHV) low temperature scanning probe microscope employing the nitrogen-vacancy color center in diamond as an ultrasensitive magnetic field sensor. Using this center as an atomic-size scanning probe has enabled imaging of nanoscale magnetic fields and single spins under ambient conditions. In this article we describe an experimental s...

2009
H. Gumpp S. W. Stahl M. Strackharn E. M. Puchner H. E. Gaub

Combining atomic force microscope AFM with other microscopy techniques has expanded the range of potential applications for single molecule investigations dramatically. Particularly hybrid instruments with total internal reflection fluorescence TIRF excitation have opened new routes in life sciences. Here we present a novel design for such a hybrid microscope, which overcomes the limitations of...

2010
Jae Hong Park Jaesool Shim Dong-Yeon Lee

A compact vertical scanner for an atomic force microscope (AFM) is developed. The vertical scanner is designed to have no interference with the optical microscope for viewing the cantilever. The theoretical stiffness and resonance of the scanner are derived and verified via finite element analysis. An optimal design process that maximizes the resonance frequency is performed. To evaluate the sc...

2009
Onejae Sul Eui-Hyeok Yang

A novel calibration technique has been developed for lateral force microscopy (LFM). Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate is required for LFM calibration. The new calibration technique reported in this paper greatly reduces the required preparation processes by simply scanning over a rigid step and measuring the response of the AFM photod...

2014
Hao Liang Guanghong Zeng Yinli Li Shuai Zhang Huiling Zhao Lijun Guo Bo Liu Mingdong Dong

The polysaccharide xanthan has been extensively studied owing to its potential application in tissue engineering. In this paper, xanthan scaffold structures were investigated by atomic force microscope (AFM) in liquid, and the mechanical properties of the complex xanthan structures were investigated by using AFM-based force spectroscopy (FS). In this work, three types of structures in the xanth...

Journal: :Biophysical journal 1996
U Dammer M Hegner D Anselmetti P Wagner M Dreier W Huber H J Güntherodt

Molecular recognition between biotinylated bovine serum albumin and polyclonal, biotin-directed IG antibodies has been measured directly under various buffer conditions using an atomic force microscope (AFM). It was found that even highly structured molecules such as IgG antibodies preserve their specific affinity to their antigens when probed with an AFM in the force mode. We could measure the...

Journal: :Nano letters 2006
Jed D Whittaker Ethan D Minot David M Tanenbaum Paul L McEuen Robert C Davis

Carbon nanotube adhesion force measurements were performed on single-walled nanotubes grown over lithographically defined trenches. An applied vertical force from an atomic force microscope (AFM), in force distance mode, caused the tubes to slip across the 250-nm-wide silicon dioxide trench tops at an axial tension of 8 nN. The nanotubes slipped at an axial tension of 10 nN after being selectiv...

This study, investigates the effect of bias voltage on structural changes of diamond-like carbon thin film created by ion beam deposition is investigated. For this purpose, the bias voltage in the values of 0 V, -50 V, -100 V and -150 V on the AA5083 aluminum alloy was considered. Raman spectroscopy was used to evaluate structural. Influence of the bias voltage on the thickness and roughness of...

2011
Átila M. Bueno José M. Balthazar José R. C. Piqueira

The Frequency Modulated Atomic Force Microscope (FM-AFM) is a powerful tool to perform surface investigation with true atomic resolution. The control system of the FM-AFM must keep constant both the frequency and amplitude of oscillation of the microcantilever during the scanning process of the sample. However, tip and sample interaction forces cause modulations in the microcantilever motion. A...

نمودار تعداد نتایج جستجو در هر سال

با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید