نتایج جستجو برای: yield

تعداد نتایج: 194156  

Journal: :Computers & OR 2008
Adam N. Letchford Nicholas A. Pearson

Consider the following heuristic for planar Euclidean instances of the traveling salesman problem (TSP): select a subset of the edges which induces a planar graph, and solve either the TSP or its graphical relaxation on that graph. In this paper, we give several motivations for considering this heuristic, along with extensive computational results. It turns out that the Delaunay and greedy tria...

2007
UMESH C. KOTHYARI SANJAY K. JAIN Umesh C. Kothyari Sanjay K. Jain

A method has been developed in the present study for the determination of the sediment yield from a catchment using a GIS. The method involves spatial disaggregation of the catchment into cells having uniform soil erosion characteristics. The surface erosion from each of the discretized cells is routed to the catchment outlet using the concept of sediment delivery ratio, which is defined as a f...

2006
Futoshi Shimizu Shigenobu Ogata Ju Li

Shear bands form in most bulk metallic glasses (BMGs) within a narrow range of uniaxial strain ey @ 2%. We propose this critical condition corresponds to embryonic shear band (ESB) propagation, not its nucleation. To propagate an ESB, the far-field shear stress s1 Eey/2 must exceed the quasi-steady-state glue traction sglue of shear-alienated glass until the glass transition temperature is appr...

2010
Quentin Barral Guillaume Ovarlez Xavier Chateau Jalila Boujlel Brooks Rabideau Philippe Coussot Q. Barral G. Ovarlez X. Chateau J. Boujlel B. Rabideau P. Coussot

The different regimes of flow when separating two solid rough surfaces in contact via a layer of a simple yield stress fluid are identified. Generic scalings for the adhesion energy and for the geometrical characteristics of the final deposits (after separation) as a function of the initial aspect ratio of the sample are found. We show that there is a strong pinning effect which might be at the...

2007
Janusz Rajski

In the past, logic diagnosis was primarily used to support failure analysis labs. It was typically done on a small sample of defective chips, therefore long processing times, manual generation of diagnostic patterns, and usage of expensive equipment was acceptable. In addition to failure analysis, yield learning relied on test chips and in line inspection. Recently, sub-wavelength lithography p...

2017
Joseph G. Robins Sara J. Helland E. Charles Brummer E. CHARLES BRUMMER

Journal: :IEEE Design & Test of Computers 2008
Sachin S. Sapatnekar

&ONE OF THE wonders of the MeadConway revolution was in providing a clean break between the design process and manufacturing. Circuits could neatly be represented by stick diagrams, and the separation requirements between features on a die could be captured by a set of design rules. In nanoscale CMOS technologies, this division between design and manufacturing is no longer as simple. In the mod...

2009
Jeffrey J. Reimer Man Li

We examine how changes in yield variability affect the welfare of cereal grain and oilseed buyers and producers around the world. We simulate trade patterns and welfare for 21 countries with a Ricardian trade model that incorporates bilateral trade costs and crop yield distributions. The model shows that world trade volumes would need to increase substantially if crop yield variability were to ...

2007
M. Zhang M. Z. Li Gang Liu M. H. Wang

Spatial variability of yield is very important in precision farming. With a yield monitor system installed on combine harvester, the yield data can be collected automatically while harvesting. In this paper, the component and the working theory of the yield monitor system were introduced. Performance of main sensors and the method improving GPS position accuracy were analyzed. Based on the anal...

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