نتایج جستجو برای: xrd measurements
تعداد نتایج: 391005 فیلتر نتایج به سال:
Polycrystalline copper sulphide (Cu x S) thin films were grown by ultrasonic spray pyrolysis method using aqueous solutions of copper chloride and thiourea without any complexing agent at various substrate temperatures of 240, 280, and 320°C. The films were characterized for their structural, optical, and electrical properties by X-ray diffraction (XRD), scanning electron microscopy (SEM), ener...
Aalto University, P.O. Box 11000, FI-00076 Aalto www.aalto.fi Author Sakari Sintonen Name of the doctoral dissertation Synchrotron radiation x-ray topography of crystallographic defects in GaN Publisher School of Electrical Engineering Unit Department of Microand Nanosciences Series Aalto University publication series DOCTORAL DISSERTATIONS 187/2014 Field of research Nanotechnology Manuscript s...
In this work, LiCoPO4 nanoparticles were synthesized by supercritical fluid method using cobalt nitrate hexahydrate (Co(NO3)2 6H2O) and cobalt acetate tetrahydrate (C4H6CoO4 4H2O) as starting materials. The effect of starting materials on particle morphology, size, and the crystalline phase were investigated. The as-synthesized samples were systematically characterized by XRD, TEM, STEM, EDS, B...
Graphene oxide-zinc oxide hybrid nanostructures were synthesized and they demonstrated significant and promising antimicrobial activity on pathogenic bacteria. The combination of graphene oxide with zinc oxide nanorods showed an impressive antibacterial effect under intense scrutiny as compared with individual graphene oxide or zinc oxide nanomaterials. The characterization and investigation of...
In this HELIOS benchmark simulation, a spherical capsule embedded in a low-density CH2 foam is imploded by an external radiation field. The parameters utilized in this benchmark simulation are taken from z-pinch-driven dynamic hohlraum experiments performed at the Z facility at Sandia National Laboratories [1]. The time-dependent hohlraum radiation field is constrained by on-axis XRD and bolome...
A series of thin silicon films with different degrees of crystallinity were prepared by decomposition of silane gas highly diluted with hydrogen, in radiofrequency glow discharge. The crystallite size, shape, and the portion of crystalline phase were investigated by highresolution transmission electron microscopy (HRTEM), selected area electron diffraction (SAED), Raman spectroscopy (RS), and X...
TiN thin films were deposited on MgO (100) substrates at different substrate temperatures using rf sputtering with Ar/N2 ratio of about 10. At 700°C, the growth rate of TiN was approximately 0.05 μm/h. The structural and electrical properties of TiN thin films were characterized with x-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron microscopy (SEM), transmission electro...
We present a slab-line waveguide whose geometry is optimized for wide-angle x-ray diffraction (XRD) experiments on protein crystals during irradiation with intense microwave fields. Characterization of the waveguide transmission and reflectivity (using time-domain reflectometry) and of the electric field distribution inside the waveguide (using finite-difference time-domain calculations) shows ...
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