نتایج جستجو برای: wenner method

تعداد نتایج: 1630341  

2016
P. Roushan C. Neill A. Megrant Y. Chen R. Babbush R. Barends B. Campbell Z. Chen B. Chiaro A. Dunsworth A. Fowler E. Jeffrey J. Kelly E. Lucero J. Mutus P. J.J. O’Malley M. Neeley C. Quintana D. Sank A. Vainsencher J. Wenner T. White E. Kapit H. Neven J. Martinis

P. Roushan1,∗ C. Neill2,∗ A. Megrant1,∗ Y. Chen, R. Babbush, R. Barends, B. Campbell, Z. Chen, B. Chiaro, A. Dunsworth, A. Fowler, E. Jeffrey, J. Kelly, E. Lucero, J. Mutus, P. J.J. O’Malley, M. Neeley, C. Quintana, D. Sank, A. Vainsencher, J. Wenner, T. White, E. Kapit, H. Neven, and J. Martinis Google Inc., Santa Barbara, CA 93117, USA Department of Physics, University of California, Santa Ba...

2011
M. Lenander H. Wang Radoslaw C. Bialczak Erik Lucero Matteo Mariantoni M. Neeley A. D. O’Connell D. Sank M. Weides J. Wenner T. Yamamoto Y. Yin J. Zhao A. N. Cleland John M. Martinis

M. Lenander,1 H. Wang,1,2 Radoslaw C. Bialczak,1 Erik Lucero,1 Matteo Mariantoni,1 M. Neeley,1 A. D. O’Connell,1 D. Sank,1 M. Weides,1 J. Wenner,1 T. Yamamoto,1,3 Y. Yin,1 J. Zhao,1 A. N. Cleland,1 and John M. Martinis1 1Department of Physics, University of California, Santa Barbara, California 93106, USA 2Department of Physics, Zhejiang University, Hangzhou 310027, China 3Green Innovation Rese...

2014
R. Barends J. Kelly A. Megrant A. Veitia D. Sank E. Jeffrey T. C. White J. Mutus A. G. Fowler B. Campbell Y. Chen Z. Chen B. Chiaro A. Dunsworth C. Neill P. O’Malley P. Roushan A. Vainsencher J. Wenner A. N. Korotkov A. N. Cleland John M. Martinis

R. Barends,1, ∗ J. Kelly,1, ∗ A. Megrant,1 A. Veitia,2 D. Sank,1 E. Jeffrey,1 T. C. White,1 J. Mutus,1 A. G. Fowler,1, 3 B. Campbell,1 Y. Chen,1 Z. Chen,1 B. Chiaro,1 A. Dunsworth,1 C. Neill,1 P. O’Malley,1 P. Roushan,1 A. Vainsencher,1 J. Wenner,1 A. N. Korotkov,2 A. N. Cleland,1 and John M. Martinis1 Department of Physics, University of California, Santa Barbara, CA 93106, USA Department of E...

2013
S. Ohya B. Chiaro A. Megrant C. Neill R. Barends Y. Chen J. Kelly D. Low J. Mutus P. J. J. O’Malley P. Roushan D. Sank A. Vainsencher J. Wenner T. C. White Y. Yin B. D. Schultz C. J. Palmstrøm B. A. Mazin A. N. Cleland John M. Martinis

S. Ohya,1, a) B. Chiaro,2 A. Megrant,2, 3 C. Neill,2 R. Barends,2 Y. Chen,2 J. Kelly,2 D. Low,2 J. Mutus,2 P. J. J. O’Malley,2 P. Roushan,2 D. Sank,2 A. Vainsencher,2 J. Wenner,2 T. C. White,2 Y. Yin,2 B. D. Schultz,1 C. J. Palmstrøm,1, 3 B. A. Mazin,2 A. N. Cleland,2 and John M. Martinis2, b) Department of Electrical and Computer Engineering, University of California, Santa Barbara, California...

Journal: :The Journal of neuroscience : the official journal of the Society for Neuroscience 2006
Sarah L Pallas Peter Wenner Carlos Gonzalez-Islas Michela Fagiolini Khaleel A Razak Gunsoo Kim Dan Sanes Birgit Roerig

Sarah L. Pallas,1 Peter Wenner,2 Carlos Gonzalez-Islas,2 Michela Fagiolini,3 Khaleel A. Razak,1 Gunsoo Kim,4 Dan Sanes,5 and Birgit Roerig6 1Department of Biology, Georgia State University, Atlanta, Georgia 30303, 2Department of Physiology, Emory University, Atlanta, Georgia 30322, 3Laboratory for Neuronal Circuit Development, RIKEN Brain Science Institute, Wako, Saitama 351-0198, Japan, 4Depar...

2017
C. Neill P. Roushan K. Kechedzhi S. Boixo S. V. Isakov V. Smelyanskiy R. Barends B. Burkett Y. Chen Z. Chen B. Chiaro A. Dunsworth A. Fowler B. Foxen R. Graff E. Jeffrey J. Kelly E. Lucero A. Megrant J. Mutus M. Neeley C. Quintana D. Sank A. Vainsencher J. Wenner T. C. White H. Neven J. M. Martinis

C. Neill1,∗ P. Roushan2,∗ K. Kechedzhi, S. Boixo, S. V. Isakov, V. Smelyanskiy, R. Barends, B. Burkett, Y. Chen, Z. Chen, B. Chiaro, A. Dunsworth, A. Fowler, B. Foxen, R. Graff, E. Jeffrey, J. Kelly, E. Lucero, A. Megrant, J. Mutus, M. Neeley, C. Quintana, D. Sank, A. Vainsencher, J. Wenner, T. C. White, H. Neven, and J. M. Martinis1,2† Department of Physics, University of California, Santa Bar...

2014
J. Wenner Yi Yin Yu Chen R. Barends B. Chiaro E. Jeffrey J. Kelly A. Megrant J. Mutus C. Neill P. J. J. O’Malley P. Roushan D. Sank A. Vainsencher T. C. White Alexander N. Korotkov A. N. Cleland John M. Martinis

J. Wenner, Yi Yin, Yu Chen, R. Barends, B. Chiaro, E. Jeffrey, J. Kelly, A. Megrant, J. Mutus, C. Neill, P. J. J. O’Malley, P. Roushan, D. Sank, A. Vainsencher, T. C. White, Alexander N. Korotkov, A. N. Cleland, and John M. Martinis Department of Physics, University of California, Santa Barbara, California 93106, USA Department of Physics, Zhejiang University, Hangzhou 310027, China Department ...

2014
P. Roushan C. Neill Y. Chen M. Kolodrubetz C. M. Quintana N. Leung Z. Chen B. Chiaro A. Dunsworth E. Je rey J. Kelly A. Megrant J. Mutus P. O'Malley D. Sank A. Vainsencher J. Wenner T. White A. Polkovnikov A. N. Cleland John M. Martinis

P. Roushan1,4,∗ C. Neill1,∗ Y. Chen1,4,∗ M. Kolodrubetz, C. M. Quintana, N. Leung, M. Fang, R. Barends, B. Campbell, Z. Chen, B. Chiaro, A. Dunsworth, E. Je rey, J. Kelly, A. Megrant, J. Mutus, P. O'Malley, D. Sank, A. Vainsencher, J. Wenner, T. White, A. Polkovnikov, A. N. Cleland, and John M. Martinis1,3† Department of Physics, University of California, Santa Barbara,CA 93106-9530, USA Depart...

2012
Yi Yin Yu Chen Daniel Sank P. J. J. O’Malley T. C. White R. Barends J. Kelly Erik Lucero Matteo Mariantoni A. Megrant C. Neill A. Vainsencher J. Wenner Alexander N. Korotkov A. N. Cleland John M. Martinis

Yi Yin, ∗ Yu Chen, Daniel Sank, P. J. J. O’Malley, T. C. White, R. Barends, J. Kelly, Erik Lucero, Matteo Mariantoni, 2 A. Megrant, C. Neill, A. Vainsencher, J. Wenner, Alexander N. Korotkov, A. N. Cleland, 2 and John M. Martinis 2, † Department of Physics, University of California, Santa Barbara, CA 93106, USA California NanoSystems Institute, University of California, Santa Barbara, CA 93106,...

2017
Jens Munk Todd Petersen Matt Cullin William Schnabel

We present a probe factor for a simple measurement device, which can be used to determine in-situ electrical resistivity in soils or other penetrable bodies. The probe is primarily sensitive to the material immediately surrounding it and therefore is ideal for determining localized conductivities. The geometry of the probe can be scaled to effectively adjust the region of interest. The calibrat...

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