نتایج جستجو برای: step beam

تعداد نتایج: 375523  

1997
Jaw-Yen Yang Min-Hung Chen I-Nan Tsai Jer-Wei Chang

used to describe the new local nonrelativistic Maxwellian distribution for each cell. The entire process is then reAn extension of the beam scheme of Sanders and Prendergast (Astrophys. J. 188, 489, 1974) for the Newtonian gas dynamics to peated for the next time step. The choice of the size of relativistic gas dynamics is presented. It is found that the relativistic the time step is dictacted ...

2015
Takeshi Higuchi Hidetoshi Nishiyama Mitsuo Suga Hirohmi Watanabe Atsushi Takahara Hiroshi Jinnai

We propose a one-step nanopatterning method where liquid monomers are polymerized directly with an electron beam under an atmospheric pressure. The method allows precise positional control of an electron beam that induces electropolymerization based on an anodic oxidation only in the irradiated areas. Various versatile conjugated polymers, including polypyrrole, polyaniline and poly(3-hexylthio...

2015
Sharath Kumar

1Basuraju S, SAP Consultant , GE Technologies, , Karnataka, India 2 Nethravathi H M, Assistant Professor, Mechatronics Department, AIT, Karnataka, India 3 Sharath Kumar A J, Assistant Professor, ECE Department, VVCE, Karnataka, India ---------------------------------------------------------------------***--------------------------------------------------------------------Abstract In order to re...

2010
Teemu Kokki Joona Koponen Marko Laurila Changgeng Ye

Power scaling of Yb-doped large-mode-area fibers drives the scaling of the mode area in order to suppress nonlinearities. Two Yb-doped large-mode-area fibers were manufactured using the Direct Nanoparticle Deposition process: one with a step refractive index profile and active ion confinement, and another with a tailored refractive index and active ion confinement. The index tailoring and dopin...

Journal: :Microelectronics Reliability 2007
C. N. Mc Auley Andreas Rummel F. W. Keating Stephan Kleindiek

A new method of investigating structures below a surface in a dual beam microscope is presented. It comprises electrical measurements in depth profiles of sequential focused ion beam (FIB) cuts by the use of two or more nanomanipulators with plugged in probe needles. The sample is oriented such that the structures are observed with the electron beam while they are cut free with the FIB. The nan...

2003
S. Reiche M. Borland P. Emma W. Fawley C. Limborg H.-D. Nuhn C. Pellegrini

The LCLS Free-Electron Lasers operates in the wavelength range of 1.5 15 Angstrom, using an electron beam with an energy between 4.5 and 14.5 GeV. The generation of the electron beam, the preservation of its brightness during acceleration and compression, and the amplification of the spontaneous radiation within the FEL can only be described by a consistent set of simulation codes. We present t...

2018
H. Zhang J. Chen R. Li Y. Zhang H. Huang L. Luo

In the JLab Electron Ion Collider (JLEIC) project the traditional electron cooling technique is used to reduce the ion beam emittance at the booster ring, and to compensate the intrabeam scattering effect and maintain the ion beam emittance during collision at the collider ring. A new electron cooling process simulation program has been developed to fulfill the requirements of the JLEIC electro...

Journal: :Accounts of chemical research 2017
Stephen T Skowron Thomas W Chamberlain Johannes Biskupek Ute Kaiser Elena Besley Andrei N Khlobystov

The main objective of this Account is to assess the challenges of transmission electron microscopy (TEM) of molecules, based on over 15 years of our work in this field, and to outline the opportunities in studying chemical reactions under the electron beam (e-beam). During TEM imaging of an individual molecule adsorbed on an atomically thin substrate, such as graphene or a carbon nanotube, the ...

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