نتایج جستجو برای: roughness measurement

تعداد نتایج: 461499  

2014
Anil Kumar Deepak Babu Rajesh Durgam

The paper presents the color image segmentation based on rough-set approach has been proposed. The color image segmentation is one of the most challenging tasks particularly in the area of image analysis, computer vision, and pattern recognition. In this paper, the proposed algorithm based on roughness index to calculate the peaks and valleys values. Based on peak and valley values to achieve b...

Journal: :Micron 2013
Siddharth Ghosh James Bowen Kyle Jiang Daniel M Espino Duncan E T Shepherd

Articular cartilage is the bearing surface of synovial joints and plays a crucial role in the tribology to enable low friction joint movement. A detailed understanding of the surface roughness of articular cartilage is important to understand how natural joints behave and the parameters required for future joint replacement materials. Bovine articular cartilage on bone samples was prepared and ...

2006
David Andrich

Many scales in psychology, education and social measurement in general, constructed to measure a single variable, are nevertheless designed to measure different aspects of the variable. The scales are often composed of subscales which measure these various aspects. These different aspects are conceptually related to the variable and are employed because they make the scale more valid than if on...

Journal: :TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series C 2001

2011
ZHENG ZHENRONG ZHOU JING

According to vector scattering and scalar scattering theory, the relationship of BRDF (bidirectional reflectance distribution function) of light scattering from micro-rough surface with TIS (total integrated scattering) is analyzed. Roughness statistical characterization such as RMS (root mean square), PSD (power spectral density) function are deduced by TIS of polished surface. Based on the li...

2004
G. P. Patsis V. Constantoudis E. Gogolides

A fast 2D/3D resist dissolution algorithm based on the critical ionization model is used to quantify line-edge roughness and determine its relation to resist polymer molecular weight, the end-to-end distance and the radius of gyration, keeping acid effects off (i.e., minimal). The algorithm permits also simulations of line-edge roughness metrology by examining the effects of SEM measurement box...

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