نتایج جستجو برای: reflectometry

تعداد نتایج: 2413  

Journal: :Review of Scientific Instruments 2010

2013
Nicolas Riesen Timothy T.-Y. Lam Jong H. Chow

Summary: We present a new optical frequency domain reflectometry technique which permits high frequency sweep repetition rates without sacrificing range. This technique could thus be adapted for remote and distributed acoustic sensing over long

2006
Mark Froggatt Dawn Gifford Steven Kreger Matthew Wolfe Brian Soller

A Rayleigh scatter-based distributed measurement technique is presented in which strain and temperature discrimination is achieved using standard polarization maintaining fiber as the sensor. High-sensitivity Optical Frequency Domain Reflectometry is used to measure the scatter.

2009
E. Piuzzi A. Cataldo L. Catarinucci

Measurement and control of the fluid parameters play a very important role in industry applications such as in the petrochemical industrial processing, where there is an increasing demand for real-time determination of dielectric parameters in relation to the product quality. Furthermore, in such a context, additional stringent requirements frequently deal with the spatial localization of non-m...

Journal: :Journal of Instrumentation 2021

Abstract A complete chain from a non-linear MHD plasma model simulation through full-wave code simulations implementing synthetic conventional reflectometry is established. For this purpose, the two-dimensional REFMUL employed together with descriptions obtained JOREK code. First results of integrated modeling are presented here where type-I ELM crash, leading to fast collapse H-mode pedestal, ...

1998
M. E. Lee C. Galarza

Specular reflected light techniques, including both single wavelength and spectroscopic versions of ellipsometry and reflectometry, have been used for both etch and growth rate control. However, use of these techniques for process control on products has been limited due to the problems inherent in the analysis of refected light from patterned structures. In this paper, we examine techniques fo...

2011
Li Xu John F. Ankner Svetlana A. Sukhishvili

Steric Effects in Ionic Pairing and Polyelectrolyte Interdiffusion within Multilayered Films: A Neutron Reflectometry Study Li Xu, John F. Ankner,* and Svetlana A. Sukhishvili* Department of Chemistry, Chemical Biology and Biomedical Engineering, Stevens Institute of Technology, Hoboken, New Jersey 07030, United States Spallation Neutron Source, Oak Ridge National Laboratory, Oak Ridge, Tenness...

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