نتایج جستجو برای: probe

تعداد نتایج: 93355  

2013
Shoubhik Gupta

4) Briefly describe any new skills you acquired during your summer research: i) I have gained hands-on experience on the fabrication of nano-scale devices in the cleanroom. ii) I Learnt the use of software tools such as Mathematica for modeling and L-Edit for device layout. iii) I learnt to use Cascade 11000 Probe Station and IPE Probe Station for the electrical characterization of fabricated t...

Journal: :Vision Research 2006
Elliot D. Freeman Jon Driver

Two ambiguous transparent structure-from-motion (SFM) stimuli often appear to co-rotate. Grossmann & Dobbins (2003) reported breakdown of such perceptual coupling when one stimulus was made unambiguous (by rendering it opaque), leading them to propose that coupling depends generally on differential stimulus ambiguity. In contrast, we demonstrate robust stimulus-driven coupling even when one SFM...

Journal: :Physical review. E, Statistical, nonlinear, and soft matter physics 2010
Guoxin Cao Namas Chandra

Viscoelastic mechanical properties of biological cells are commonly measured using atomic force microscope (AFM) dynamic indentation with spherical tips. A semiempirical analysis based on numerical simulation is built to determine the cell mechanical properties. It is shown that the existing analysis cannot reflect the accurate values of cell elastic/dynamic modulus due to the effects of substr...

2017
Hyelee Lee

.........................................................................................iii ACKNOWLEDGEMENTS........................................................................v LIST OF FIGURES ................................................................................viii CHAPTER

Journal: :Physical review. E, Statistical, nonlinear, and soft matter physics 2002
H Schiessel G Oshanin A M Cazabat M Moreau

We study long-range morphological changes in atomic monolayers on solid substrates induced by different types of defects; e.g., by monoatomic steps in the surface, or by the tip of an atomic force microscope (AFM), placed at some distance above the substrate. Representing the monolayer in terms of a suitably extended Frenkel-Kontorova-type model, we calculate the defect-induced density profiles...

Journal: :Kobunshi 2005

Journal: :Canadian Journal of Communication 2019

Journal: :Ultramicroscopy 2008
Haw-Long Lee Win-Jin Chang

We study the influence of the contact stiffness and the ration between cantilever and tip lengths on the resonance frequencies and sensitivities of lateral cantilever modes. We derive expressions to determine both the effective resonance frequency and the mode sensitivity of an atomic force microscope (AFM) rectangular cantilever. Once the contact stiffness is given, the resonance frequency and...

نمودار تعداد نتایج جستجو در هر سال

با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید