Among all the On-Chip built-in self-test (BIST) technologies, JTAG is the most well-known and widely used. In this paper, the mechanism of basic JTAG (IEEE 1149.1) has been discussed. The pitfalls of the method are also discussed, some of which are rectified in the future standard, IEEE 1149.4 for Mixed Signal testing, which is also described here. Many of the valuable research papers on these ...

We prove sharp convergence rates for a class of domain embedding methods for elliptic boundary value problems. The theory is established for Dirichlet, Neumann, and Robin boundary conditions, and is unified in a new formulation for mixed boundary condition. On the continuous level, the methods for these boundary value problems perform equally well.