Abstract The R-200 low power Hall thruster unit completed a 96 kNs endurance test, during which the anode mass flow rate was adjusted to maintain constant of 250 W throughout campaign. test performed at Rafael, while initial performance validation conducted ESTEC. At end exhibited nearly unchanged and did not reach its end-of-life. During characterized 5 times in 100–250 discharge range, cerami...

this paper proposes a low voltage (±0.55v supply voltage) low power (44.65µw) high common mode rejection ratio (cmrr) differential amplifier (d.a.) with rail to rail input common mode range (icmr), constant transconductance (gm) and enhanced frequency performance. its high performance is obtained using a simple negative averaging method so that it cancels out the common mode input signals at th...

Now a day’s highly integrated multi layer board with IC’s is virtually impossible to be accessed physically for testing. The major problem detected during testing a circuit includes test generation and gate to I/O pin problems. In design of any circuit, consuming low power and less hardware utilization is an important design parameter. Therefore reliable testing methods are introduced which red...

a novel low noise trans-impedance amplifier is proposed using low cost 0.18 µm cmos technology. a resistive-capacitive feedback is used to extend the bandwidth of the amplifier. as the structure is inductor less, it is suitable for low cost integrated optical interconnects. in this paper improved particle swarm optimization have applied to determine optimal trans-resistance and noise of propose...

most of electricity is generated by thermal power plants in iran. shahid rajaee thermal power plant consists of four 250mw natural gas and fuel oil burning units that is located at 100 km west off tehran. as a result of fuel oil burning in winter time, boilers air heaters are washed and cleaned frequently. the wastewater originating from air heater washing contains suspended solids and differen...

VLSI circuit’s encounters are rapidly many challenging tasks of semiconductor manufacturing along operating with gigahertz range of frequencies. These challenges are include keeping peak power dissipation and the application time within limits. In this Paper we are proposes a new approach of low power Test Pattern Generator (TPG) designed by modifying parallel Linear Feedback Shift Register (Pa...

The push for portable, battery-operated, and “cool-and-green” electronics has elevated power consumption as the defining metric of integrated circuit (IC) design. Testing ICs built for such applications requires judicious consideration of test power implications on various aspects of the design cycle (e.g., packaging and power grid design), test engineering (multi-site ATE power supply limitati...